SMEAL WIKI

Semi-Markov models for degradation-based reliability

Jeffrey P. Kharoufeh, Christopher J. Solo, Mehmet Yasin Ulukuş
Year2010
VenueIIE Transactions
Typearticle
Citations103
DOI10.1080/07408170903394371
OpenAlexW2020891120

Topics

Reliability and Maintenance OptimizationReliability (semiconductor)Markov chainMarkov processDegradation (telecommunications)Moment (physics)