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Measuring Distress Risk: The Effect of R&D Intensity

Laurel Franzen, Kimberly Rodgers Cornaggia, Timothy T. Simin
Year2006
VenueSSRN Electronic Journal
Typepreprint
Citations16
DOI(no DOI)
OpenAlexW3122111446

Topics

Financial Distress and Bankruptcy PredictionExtant taxonDistressFinancial distressAccountingActuarial science